Science and research

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FALAB Laboratory has completed a large number of scientific research tasks in the quality and failure analysis of electronic components and microelectronics technology, which has accumulated a solid technical foundation for providing technical services in leading industries. In recent years, along with the enterprise's life assessment of electronic products, process quality improvement and product reliability growth, it provides related scientific research and technical support and practical problem solutions for enterprises.

Research Objects

Integrated Circuit
PCB & PCBA
Hybrid Integrated Circuit
Photoelectron Device
Microwave Device
Resistor, Capacitance, Relay, Connector
RoHS & Pollution Administration system

Research Areas

Reliability Physics
Failure Mode & Failure Mechanism
Reliability Design and Simulation
ESD Design
FEA
Process Control
TCPI
Failure Analysis and Material Analysis
FIB、EB、SEM
Reliability Test, Evaluation
Reliability of Solder Joint for Assembly & package
HAST
Life Prediction
Reliability Growth
PoF Reliability Growth

Achievements

RoHS & Pollution Administration system
Reliability Datebase
Equipment Development

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Industrial Automotive Testing：

4008-285-622

FALAB Judicial Identification：

4008-850-960

FALAB Insurance Identification：

4008-310-580

FALAB Insurance Assessment：

4009-282-155

FALAB Ship Testing：

4008-202-508

Shanghai Laboratory：

NO.1600 A8 Building, GuoQuan North Road,

Yangpu District, Shanghai City

Suzhou Laboratory：

NO.16th Building, NO.99th GangTian Road,

Suzhou Industrial Park, Suzhou City, Jiangsu Province